A Built-In Self-Testing Method for Embedded Multiport Memory Arrays
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IEEE Transactions on Instrumentation and Measurement
سال: 2005
ISSN: 0018-9456
DOI: 10.1109/tim.2005.855093